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Created with Pixso. 4H Silicon Carbide Substrate for Power Electronics, RF Devices & UV Optoelectronics

4H Silicon Carbide Substrate for Power Electronics, RF Devices & UV Optoelectronics

Marchio: ZMSH
MOQ: 10
Tempo di consegna: 2-4 settimane
Condizioni di pagamento: T/T
Informazioni dettagliate
Luogo di origine:
Shanghai, Cina
Materiale:
Cristallo singolo 4H-SiC (tipo N)
Dimensioni:
10×10 mm (±0,05 mm)
Opzioni di spessore:
100–500 μm
Orientamento:
(0001) ± 0,5°
Qualità della superficie:
CMP / Lucido, Ra ≤ 0,5 nm
Colore:
Tonalità superficiale del tè verde (tipico SiC
Resistività:
0,01–0,1 Ω·cm
Difetti:
MPD < 1 cm⁻²
Descrizione di prodotto

4H Silicon Carbide Substrate  for Power Electronics, RF Devices & UV Optoelectronics


Product Overview


The 4H-SiC Substrate is a high-purity, single-crystal silicon carbide material designed for advanced power electronics, RF devices, and optoelectronic applications. Produced through the PVT method and finished with precision CMP polishing, each substrate features ultra-low defect density, excellent thermal conductivity, and stable electrical characteristics.


Its compact size is ideal for R&D, device prototyping, laboratory testing, and small-scale production.


4H Silicon Carbide Substrate  for Power Electronics, RF Devices & UV Optoelectronics 04H Silicon Carbide Substrate  for Power Electronics, RF Devices & UV Optoelectronics 1

Key Features

✔ Prime-Grade Crystal Quality

  • Polytype: 4H-SiC

  • Conductivity: N-type doped

  • Micropipe Density (MPD): <1 cm⁻²

  • Dislocation Density: <10⁴ cm⁻²


✔ Ultra-Smooth Polished Surfaces

  • Si-face (CMP): Ra ≤ 0.5 nm

  • C-face (polished): Ra ≤ 1 nm

  • Epitaxy-ready finish for high-quality epitaxial growth


✔ Stable Electrical Properties

  • Resistivity: 0.01–0.1 Ω·cm

  • Carrier concentration: 1×10¹⁸ – 5×10¹⁹ cm⁻³

  • Ideal for high-voltage and high-frequency device structures


✔ Excellent Thermal Performance

  • Thermal conductivity: 490 W/m·K

  • Operating temperature capability: up to 600°C

  • Low thermal expansion coefficient: 4.0×10⁻⁶ /K


✔ High Mechanical Strength

  • Vickers hardness: 28–32 GPa

  • Flexural strength: >400 MPa

  • Long service life and excellent wear resistance


Technical Specifications


Category Specification
Material 4H-SiC Single Crystal (N-type)
Dimensions 10×10 mm (±0.05 mm)
Thickness Options 100–500 μm
Orientation (0001) ± 0.5°
Surface Quality CMP / Polished, Ra ≤ 0.5 nm
Resistivity 0.01–0.1 Ω·cm
Thermal Conductivity 490 W/m·K
Defects MPD < 1 cm⁻²
Color Green-tea surface tone (SiC typical)
Grade Options Prime, Research, Dummy


Available Customization


  • Non-standard sizes: 5×5 mm, 5×10 mm, Ø2–8 inch round substrates

  • Thickness: 100–500 μm or custom

  • Orientation: 4°, 8°, or on-axis

  • Surface finish: Single-side polish / double-side polish

  • Doping: N-type, P-type, semi-insulating

  • Backside metallization


Application Areas


1. Power Electronics

Ideal for SiC MOSFETs, SBDs, diodes, and high-voltage device prototyping.


2. RF & 5G Infrastructure

Used for RF power amplifiers (PA), switches, and millimeter-wave devices.


3. New Energy Vehicles

Supports EV inverter development, power module R&D, and wide-bandgap testing.


4. Aerospace & Defense

High-temperature and radiation-resistant electronic components.


5. Optoelectronics

UV LEDs, photodiodes, laser diodes, and GaN-on-SiC structures.


6. University & Laboratory R&D

Material research, epitaxy experiments, device fabrication.


FAQ


1. What is the main advantage of 4H-SiC compared with 6H-SiC?


4H-SiC offers higher electron mobility, lower on-resistance, and superior performance in high-power and high-frequency devices. It is the industry-preferred material for MOSFETs, diodes, and advanced power modules.


2. Do you provide conductive or semi-insulating SiC substrates?


Yes. We offer N-type conductive 4H-SiC for power electronics and semi-insulating 4H-SiC for RF, microwave, and UV detector applications. Doping level and resistivity can be customized.


3. Can the substrate be used directly for epitaxy?


Yes. Our epi-ready 4H-SiC substrates feature CMP-polished Si-face surfaces with low defect density, suitable for MOCVD, CVD, and HVPE epitaxial growth of GaN, AlN, and SiC layers.